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Mapping of Charge Distribution in Organic Field-Effect Transistors by Confocal Photoluminescence Electromodulation Microscopy

Articolo
Data di Pubblicazione:
2014
Citazione:
Mapping of Charge Distribution in Organic Field-Effect Transistors by Confocal Photoluminescence Electromodulation Microscopy / Koopman, W.A., Toffanin, S., Natali, M., Troisi, S., Capelli, R., Biondo, V., Stefani, A., Muccini, M.. - In: NANO LETTERS. - ISSN 1530-6984. - 14:4(2014), pp. 1695-1700. [10.1021/nl402603c]
Abstract:
A novel method for mapping the charge density spatial distribution in organic field-effect transistors based on the electromodulation of the photoluminescence is demonstrated. In field-effect transistors exciton quenching is dominated by exciton–charge carrier interaction so that it can be used to map the charge distribution in different operating conditions. From a quantitative analysis of the photoluminescence quenching, the thickness of the charge carrier accumulation layer is derived. The injection of minority charge carriers in unipolar conditions is unexpectedly evidenced, which is not displayed by the electrical characteristics.
Tipologia CRIS:
Articolo su rivista
Keywords:
confocal microscopy; organic transistirs; charge density
Elenco autori:
Koopman, W A; Toffanin, S; Natali, M; Troisi, S; Capelli, R; Biondo, V; Stefani, A; Muccini, M
Autori di Ateneo:
CAPELLI Raffaella
Link alla scheda completa:
https://iris.unimore.it/handle/11380/1176679
Pubblicato in:
NANO LETTERS
Journal
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