Data di Pubblicazione:
1998
Citazione:
Correlation between light emission and currents in pseudomorphic HEMTs / Cova, P.; Fantini, Fausto; Manfredi, M.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 38:(1998), pp. 507-510. [10.1016/S0026-2714(97)00233-1]
Abstract:
In this paper we demonstrate the straight correlation between the integrated light emitted and the DC currents in GaAs-based pseudomorphic HEMTs biased at huigh drain voltage, when, due to hot electrons. impact ionization takes place.
Tipologia CRIS:
Articolo su rivista
Keywords:
PHEMT.
Light emission.
Elenco autori:
Cova, P.; Fantini, Fausto; Manfredi, M.
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