Data di Pubblicazione:
1987
Citazione:
Text fixture for MESFET reliability life tests / C., Canali; F., Chiussi; Fantini, Fausto; G., Muzzin; L., Umena. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 27:(1987), pp. 897-911. [10.1016/0026-2714(87)90337-2]
Abstract:
DC tests may be the method on which to found an unitary methodology for setting and analysis of GaAs MESFET reliability studies. Each failure mechanism must be stressed without introducing erroneous one, due to the artificial conditions of accelerated tests. A text fixture for these tests must enable the hgghest contro of aging conditions.
Tipologia CRIS:
Articolo su rivista
Keywords:
Reliability.
MESFET.
Life test.
Elenco autori:
C., Canali; F., Chiussi; Fantini, Fausto; G., Muzzin; L., Umena
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