Erratum: A comparative analysis of substrate current generation mechanisms in tunneling MOS capacitors (IEEE Electron Devices (2002) 49 (1427-1435))
Abstract
Publication Date:
2002
Short description:
Erratum: A comparative analysis of substrate current generation mechanisms in tunneling MOS capacitors (IEEE Electron Devices (2002) 49 (1427-1435)) / Palestri, P.; Serra, A. D.; Selmi, L.; Pavesi, M.; Rigolli, P. L.; Abramo, A.; Widdershoven, F.; Sangiorgi, E.. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 49:10(2002), pp. 1844-1844. [10.1109/TED.2002.804309]
Iris type:
Abstract in Rivista
List of contributors:
Palestri, P.; Serra, A. D.; Selmi, L.; Pavesi, M.; Rigolli, P. L.; Abramo, A.; Widdershoven, F.; Sangiorgi, E.
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