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  1. Pubblicazioni

Verification and Validation based on the generation of Testing Sequences from Timing Diagram Specifications in Industrial Automation

Contributo in Atti di convegno
Data di Pubblicazione:
2015
Citazione:
Verification and Validation based on the generation of Testing Sequences from Timing Diagram Specifications in Industrial Automation / Racchetti, L; Fantuzzi, C; Tacconi, L. - (2015), pp. 2816-2821. ( 41st Annual Conference of the IEEE Industrial Electronics Society, IECON 2015 Pacifico Yokohama, jpn 2015) [10.1109/IECON.2015.7392529].
Abstract:
We present Timing Diagram Testing for Verification & Validation (T4V, which is red as "tav") for Industrial Automation Systems. T4V is our approach to address the problem of generating test sequence to verify & validate (V&V) industrial automation systems software.T4V aims to solve this problem by generating test sequences from the timing diagrams of software specifications. Then, run them in Real-Time (RT) onto the PLC, check part of their conformance on-the-run, save the test outlines, and automatically analyze the outlines through an algorithmic verification.We currently implemented T4V for IEC61131-3 platforms (e.g. Beckhoff TwinCAT3) and Rockwell Automation PLCs, but we are integrating it only in our testing and V&V platform for Beckhoff PLCs.We believe that T4V may simplify and/or face the challenges of V&V in order to enable a more efficient and effective testing. Moreover, we believe that it could help PLC providers to understand the needs of an environment with testing and V&V features integrated.
Tipologia CRIS:
Relazione in Atti di Convegno
Elenco autori:
Racchetti, L; Fantuzzi, C; Tacconi, L
Autori di Ateneo:
FANTUZZI Cesare
Link alla scheda completa:
https://iris.unimore.it/handle/11380/1223034
Titolo del libro:
IECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society
Pubblicato in:
PROCEEDINGS OF THE ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY
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