Noise in resistive random access memory devices

Chapter
Publication Date:
2020
Short description:
Noise in resistive random access memory devices / Puglisi, F.M. - In: Noise in Nanoscale Semiconductor Devices / [a cura di] Tibor Grasser. - [s.l] : Springer International Publishing, 2020. - ISBN 978-3-030-37499-0. - pp. 87-133 [10.1007/978-3-030-37500-3_3]
Iris type:
Capitolo/Saggio
List of contributors:
Authors of the University:
Handle:
https://iris.unimore.it/handle/11380/1227676
Book title:
Noise in Nanoscale Semiconductor Devices