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  1. Research Outputs

Noise in resistive random access memory devices

Chapter
Publication Date:
2020
Short description:
Noise in resistive random access memory devices / Puglisi, F. M.. - (2020), pp. 87-133. [10.1007/978-3-030-37500-3_3]
Iris type:
Capitolo/Saggio
List of contributors:
Puglisi, F. M.
Authors of the University:
PUGLISI Francesco Maria
Handle:
https://iris.unimore.it/handle/11380/1227676
Book title:
Noise in Nanoscale Semiconductor Devices
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