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A simple multiparametric analysis to guide, compare and optimize the design of 'lensless' LED illuminators

Contributo in Atti di convegno
Data di Pubblicazione:
2021
Citazione:
A simple multiparametric analysis to guide, compare and optimize the design of 'lensless' LED illuminators / Cattini, S.; Pancaldi, F.; Bertacchini, A.; Parmeggiani, A.. - 2021-:(2021), pp. 1-6. ( 2021 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2021 Technology and Innovation Centre (TIC), gbr 2021) [10.1109/I2MTC50364.2021.9460007].
Abstract:
LED lighting is becoming increasingly pervasive in many areas ranging from ambient lighting, up to applications such as microscope illumination, UV-LED curing and, UV disinfection for air, surfaces, and water. Irradiance uniformity is often a fundamental parameter for guiding the design, comparison, and optimization of the illuminator. To this end, many methods and procedures have been proposed to guide the arrangement of the LED sources, as well as to guide the design of ad-hoc lenses. Nevertheless, there are many applications in which it is important to be able to consider other aspects as well as the uniformity of the irradiance. For this purpose, we propose both a method that allows calculating the irradiance generated by the used LED sources and, performance indicators for guiding the design and comparing different optical layouts.
Tipologia CRIS:
Relazione in Atti di Convegno
Keywords:
COVID-19; Germicidal Ultraviolet (GUV); LED illuminators; LED lighting; Ultraviolet germicidal irradiation (UGI); UV disinfection; UV-LED curing
Elenco autori:
Cattini, S.; Pancaldi, F.; Bertacchini, A.; Parmeggiani, A.
Autori di Ateneo:
BERTACCHINI Alessandro
CATTINI Stefano
PANCALDI Fabrizio
Link alla scheda completa:
https://iris.unimore.it/handle/11380/1253237
Titolo del libro:
Conference Record - IEEE Instrumentation and Measurement Technology Conference
Pubblicato in:
CONFERENCE PROCEEDINGS - IEEE INSTRUMENTATION/MEASUREMENT TECHNOLOGY CONFERENCE
Journal
CONFERENCE PROCEEDINGS - IEEE INSTRUMENTATION/MEASUREMENT TECHNOLOGY CONFERENCE
Series
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