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A Time-Saving Approach for the Thermal Lifetime Evaluation of Low-Voltage Electrical Machines

Articolo
Data di Pubblicazione:
2020
Citazione:
A Time-Saving Approach for the Thermal Lifetime Evaluation of Low-Voltage Electrical Machines / Madonna, V.; Giangrande, P.; Migliazza, G.; Buticchi, G.; Galea, M.. - In: IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS. - ISSN 0278-0046. - 67:11(2020), pp. 9195-9205. [10.1109/TIE.2019.2956378]
Abstract:
Modern electrical machines, such as those employed in transportation applications are required to provide very high performance in terms of power (and torque) density and efficiency. The reality, however, is that the more these machines are 'pushed' in relation to power density, the more is the probability of failure of their insulation systems, through enhanced electrical and thermal stresses. On the other hand, regardless the power density level, the electrical machine still needs to respect the certification processes set by the international standards and procedures. Unfortunately, today reliability and lifetime are still not considered as main design objective functions right from the start of the design process. This is a direct result of a gap in knowledge in terms of the precise understanding of failure mechanisms. If physics of failure models are available, then reliability can be included at all design stages. Therefore, this article proposes a method that shortens the time demanded for the thermal lifetime evaluation procedure or qualification of low-voltage electrical machines. The theory behind the method is presented and, then, experimentally validated on custom designed specimens.
Tipologia CRIS:
Articolo su rivista
Keywords:
Design of experiments; dielectric breakdown; dielectric losses; electric motors; electrical machines (EMs); insulation; physics of failure (PoF); thermal factors; thermal stresses
Elenco autori:
Madonna, V.; Giangrande, P.; Migliazza, G.; Buticchi, G.; Galea, M.
Autori di Ateneo:
MIGLIAZZA Giovanni
Link alla scheda completa:
https://iris.unimore.it/handle/11380/1281068
Pubblicato in:
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
Journal
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