Publication Date:
2020
Short description:
Long-Term Aging of Al2O3Passivated and Unpassivated Flexible a-IGZO TFTs / Costa, Jc; Kermani, ; Cantarella, Giuseppe; Cantarella, G; Petti, L; Vogt, C; Daus, A; Knobelspies, S; Troster, G; Munzenrieder, Ns. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 67:11(2020), pp. 4934-4939. [10.1109/TED.2020.3026613]
Iris type:
Articolo su rivista
Keywords:
Passivation; Flexible electronics; Storage stability; Gate stress; Thin-film transistors (TFTs); Indium-gallium-zinc-oxide (IGZO)
List of contributors:
Costa, Jc; Kermani, ; Cantarella, Giuseppe; Cantarella, G; Petti, L; Vogt, C; Daus, A; Knobelspies, S; Troster, G; Munzenrieder, Ns
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