A Methodology to Extract the Channel Current of Permeable Gate Oxide MOSFETs

Academic Article

Publication Date:

2003

Short description:

A Methodology to Extract the Channel Current of Permeable Gate Oxide MOSFETs / Palestri, P; Esseni, D.; Selmi, L.; Guegan, G.; Sangiorgi, E.. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 50:5(2003), pp. 1314-1321. [10.1109/TED.2003.813245]

Iris type:

Articolo su rivista

Keywords:

Gate leakage; Mobility extraction; MOSFETs; Parameter extraction; Ultrathin oxide;

List of contributors:

Palestri, P; Esseni, D.; Selmi, L.; Guegan, G.; Sangiorgi, E.

Authors of the University:

PALESTRI Pierpaolo

SELMI LUCA

Handle:

https://iris.unimore.it/handle/11380/1328100

Published in:

IEEE TRANSACTIONS ON ELECTRON DEVICES

Journal