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Introduction of Zr in Mg/Co nanometric periodic multilayers

Contributo in Atti di convegno
Data di Pubblicazione:
2010
Citazione:
Introduction of Zr in Mg/Co nanometric periodic multilayers / Karine Le, Guen; Min Hui, Hu; Jean Michel, Andre; Philippe, Jonnard; Sika, Zhou; Haochuan, Li; Jingtao, Zhu; Zhanshan, Wang; Nicola, Mahne; Angelo, Giglia; Nannarone, Stefano; Christian, Meny. - STAMPA. - 102:(2010), pp. 799525-799525-5. ( 7th International Conference on Thin Film Physics and Applications Shanghai, PEOPLES R CHINA SEP 24-27, 2010) [10.1117/12.888193].
Abstract:
We study the introduction of a third material, namely Zr, within a nanometric periodic Mg/Co structure designed to work as optical component in the extreme UV (EUV) spectral range. Mg/Co, Mg/Zr/Co, Mg/Co/Zr and Mg/Zr/Co/Zr multilayers are designed, and then characterized in terms of structural quality and optical performances through X-ray and EUV reflectometry measurements, respectively. For the Mg/Co/Zr structure, the reflectance value is equal to 50% at 25.1 nm and 45° of grazing incidence and reaches 51.3% upon annealing at 200°C. Measured EUV reflectivity values of tri-layered systems are discussed in terms of material order within a period and compared to the predictions of the theoretical model of Larruquert. Possible applications are pointed out.
Tipologia CRIS:
Relazione in Atti di Convegno
Keywords:
multilayer
Elenco autori:
Karine Le, Guen; Min Hui, Hu; Jean Michel, Andre; Philippe, Jonnard; Sika, Zhou; Haochuan, Li; Jingtao, Zhu; Zhanshan, Wang; Nicola, Mahne; Angelo, Giglia; Nannarone, Stefano; Christian, Meny
Link alla scheda completa:
https://iris.unimore.it/handle/11380/742991
Titolo del libro:
SEVENTH INTERNATIONAL CONFERENCE ON THIN FILM PHYSICS AND APPLICATIONS
Pubblicato in:
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Journal
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Series
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