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Determination of the transmittance and extinction coefficient of Yb films in the 23-1700 eV rangeProceedings of SPIE

Contributo in Atti di convegno
Data di Pubblicazione:
2006
Citazione:
Determination of the transmittance and extinction coefficient of Yb films in the 23-1700 eV rangeProceedings of SPIE / Juan I., Larruquert; Monica Fernandez, Perea; Jose A., Aznarez; Jose A., Mendez; Luca, Poletto; Denis, Garoli; A., Marco Malvezzi; Angelo, Giglia; Nannarone, Stefano. - STAMPA. - 6317:(2006), pp. 63170S-63170S-12. ( Advances in X-Ray/EUV Optics, Components, and Applications San Diego, CA, usa AUG 14-16, 2006) [10.1117/12.680930].
Abstract:
The transmittance of thin films of Yb deposited by evaporation in ultra high vacuum (UHV) conditions have been investigated in the 23-1,700 eV spectral range. Transmittance measurements were performed in situ on Yb films deposited over grids coated with a thin, C support film. Transmittance measurements were used to obtain the extinction coefficient of Yb films at each individual photon energy investigated. The energy range investigated encompasses M, N, and O edges of Yb. The current results, along with data in the literature, show that Yb has an interesting low-absorption band in the ∼12-24 eV range. The promising characteristics of Yb as a filter material in this region requires the development of a protection material due to the reactivity of Yb under normal atmosphere. The low absorption of Yb in the above range makes it also a candidate for a component of multilayer coatings in a spectral region in which few developments have been performed due to the lack of low absorption materials. The f1 sum-rule was applied to extinction coefficient data in the whole spectrum that included the current data along with those of the literature, resulting in a value of 70.26, which is close to the expected value of 69.32.},
Tipologia CRIS:
Relazione in Atti di Convegno
Keywords:
optical properties; rare earths
Elenco autori:
Juan I., Larruquert; Monica Fernandez, Perea; Jose A., Aznarez; Jose A., Mendez; Luca, Poletto; Denis, Garoli; A., Marco Malvezzi; Angelo, Giglia; Nannarone, Stefano
Link alla scheda completa:
https://iris.unimore.it/handle/11380/743066
Titolo del libro:
ADVANCES IN X-RAY/EUV OPTICS, COMPONENTS, AND APPLICATIONS
Pubblicato in:
PROCEEDINGS OF SPIE
Journal
PROCEEDINGS OF SPIE
Series
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