High-resolution mapping of the electrostatic potential in organic thin-film transistors by phase electrostatic force microscopy
Articolo
Data di Pubblicazione:
2007
Citazione:
High-resolution mapping of the electrostatic potential in organic thin-film transistors by phase electrostatic force microscopy / Annibale, P., Albonetti, C., Stoliar, P., Biscarini, F.. - In: JOURNAL OF PHYSICAL CHEMISTRY. A, MOLECULES, SPECTROSCOPY, KINETICS, ENVIRONMENT, & GENERAL THEORY. - ISSN 1089-5639. - 111:49(2007), pp. 12854-12858. [10.1021/jp709590p]
Tipologia CRIS:
Articolo su rivista
Elenco autori:
Annibale, P; Albonetti, C; Stoliar, P; Biscarini, Fabio
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