Data di Pubblicazione:
2009
Citazione:
Measurement of DNA Morphological Parameters at Highly Entangled Regime on Surfaces / A., C., P., S., E., B., F., V., Biscarini, F.. - In: JOURNAL OF PHYSICAL CHEMISTRY. B, CONDENSED MATTER, MATERIALS, SURFACES, INTERFACES & BIOPHYSICAL. - ISSN 1520-6106. - ELETTRONICO. - 113:15(2009), pp. 4987-4990. [10.1021/jp8097318]
Abstract:
The morphology of circular DNA deposited from a solution on the mica surface is analyzed from the power spectrum density (PSD) of the atomic force microscopy (AFM) images. Sample morphology is modulated in a broad range of concentration C from isolated molecules to highly entangled networks. DNA exhibits a multiaffine behavior with two correlation length scales: the persistence length P which remains constant (approximate to 50 nm) within the C range and the intermolecular distance which exhibits a decay with increasing C. Applying a diffusion based model in which xi scales as xi approximate to D(-0.25)center dot C(-0.5), we extracted the DNA diffusion coefficient D approximate to 2 x 10(-7) cm(2)/S. This value is consistent with a high-molecular-weight plasmid DNA supercoiled in the solution.
Tipologia CRIS:
Articolo su rivista
Keywords:
ATOMIC-FORCE MICROSCOPY, REPLICATION, INTERCALATION, DYNAMICS, MICA
Elenco autori:
A., Calò; P., Stoliar; E., Bystrenova; F., Valle; Biscarini, Fabio
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