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  1. Pubblicazioni

A simple calibration method to quantify the effects of head movements on vision-based eye-tracking systems

Contributo in Atti di convegno
Data di Pubblicazione:
2016
Citazione:
A simple calibration method to quantify the effects of head movements on vision-based eye-tracking systems / Cattini, Stefano; Rovati, Luigi. - 2016-:(2016), pp. 883-888. ( 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 Taipei International Convention Center, twn 2016) [10.1109/I2MTC.2016.7520483].
Abstract:
A simple method for the calibration of eye-tracking systems based on eye-features detection is proposed. Many eye-tracking systems are claimed to be robust to head movements in some degree, but such robustness is rarely fully quantified. Moving chin-rest and synthetic images have been proposed to investigate head movements. However, both methods have several limitations. The reported calibration method exploits for the first time ocular imaging eye models (OIEMs) in order to simulate the eye(s), thus allowing to easily investigate the effects due to head movements. Moreover, it can be useful for the development and comparison of eye-tracking hardware, software and whole systems. Differently from human subjects, OIEMs are standardized and time-invariant thus, comparisons can be performed at different times and places, leading OIEMs to be a potential gold standard test for eye-tracking systems. Preliminary verification performed on a basic eye tracking system corroborate the applicability of described method.
Tipologia CRIS:
Relazione in Atti di Convegno
Keywords:
Calibration; Machine vision; Measurement; Measurement errors; Optical imaging; Optics; Electrical and Electronic Engineering
Elenco autori:
Cattini, Stefano; Rovati, Luigi
Autori di Ateneo:
CATTINI Stefano
ROVATI Luigi
Link alla scheda completa:
https://iris.unimore.it/handle/11380/1134032
Titolo del libro:
Conference Record - IEEE Instrumentation and Measurement Technology Conference
Pubblicato in:
CONFERENCE PROCEEDINGS - IEEE INSTRUMENTATION/MEASUREMENT TECHNOLOGY CONFERENCE
Journal
CONFERENCE PROCEEDINGS - IEEE INSTRUMENTATION/MEASUREMENT TECHNOLOGY CONFERENCE
Series
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