Multi-Subband Monte-Carlo study of Transport, Quantization and Electron Gas Degeneration in Ultra-Thin SOI n-MOSFETs

Academic Article

Publication Date:

2007

Short description:

Multi-Subband Monte-Carlo study of Transport, Quantization and Electron Gas Degeneration in Ultra-Thin SOI n-MOSFETs / Lucci, L; Palestri, Pierpaolo; Esseni, David; Bergagnini, L; Selmi, Luca. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 54:5(2007), pp. 1156-1164. [10.1109/TED.2007.894606]

Iris type:

Articolo su rivista

Keywords:

Back-scattering; Ballistic transport; Monte Carlo (MC) method; MOSFETs; Scattering; Semiconductor device modeling; Silicon-on-insulator (SOI);

List of contributors:

Lucci, L; Palestri, Pierpaolo; Esseni, David; Bergagnini, L; Selmi, Luca

Authors of the University:

PALESTRI Pierpaolo

SELMI LUCA

Handle:

https://iris.unimore.it/handle/11380/1163068

Published in:

IEEE TRANSACTIONS ON ELECTRON DEVICES

Journal