Understanding Quasi-Ballistic Transport in nano-MOSFETs. Part II: Technology Scaling along the ITRS
Academic Article
Publication Date:
2005
Short description:
Understanding Quasi-Ballistic Transport in nano-MOSFETs. Part II: Technology Scaling along the ITRS / Eminente, S.; Esseni, David; Palestri, Pierpaolo; Fiegna, C; Selmi, Luca; Sangiorgi, E.. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 52:12(2005), pp. 2736-2743. [10.1109/TED.2005.859566]
abstract:
The on-current and its ballistic limit for MOSFETs
designed according to the 2003 International Technology
Roadmap for Semiconductors down to the 45-nm node, are evaluated
by using the full-band, self-consistent Monte Carlo simulator
with quantum–mechanical corrections described in Part I. Our
results show that quasi-ballistic transport increases for G below
approximately 50 nm and contributes most part of the ON improvements
related to scaling. Thanks to a lower vertical electric
field, double-gate silicon-on-insulator MOSFETs with ultrathin
body and low channel doping achieve performance closer to the
ballistic limit than the bulk counterparts.
Iris type:
Articolo su rivista
Keywords:
Back-scattering; Ballistic transport; Monte Carlo method (MC); MOSFETs; Semiconductor device modeling; Silicon- on-insulator (SOI)
List of contributors:
Eminente, S.; Esseni, David; Palestri, Pierpaolo; Fiegna, C; Selmi, Luca; Sangiorgi, E.
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