Verification of Electron Distributions in Silicon by means of Hot-Carrier Luminescence Measurements

Academic Article

Publication Date:

1998

Short description:

Verification of Electron Distributions in Silicon by means of Hot-Carrier Luminescence Measurements / Selmi, Luca; Mastrapasqua, M; Boulin, D. M; Bude, J; Pavesi, M; Sangiorgi, E; Pinto, M. R.. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 45:4(1998), pp. 802-808. [10.1109/16.662779]

Iris type:

Articolo su rivista

List of contributors:

Selmi, Luca; Mastrapasqua, M; Boulin, D. M; Bude, J; Pavesi, M; Sangiorgi, E; Pinto, M. R.

Authors of the University:

SELMI LUCA

Handle:

https://iris.unimore.it/handle/11380/1163437

Published in:

IEEE TRANSACTIONS ON ELECTRON DEVICES

Journal