Citazione:
INTERFEROMETRICAL, OPTICAL RETROREFLECTION WITH LOW COHERENCE SOURCE / Rovati, Luigi.
Abstract:
Carrying out measurements of distances and thicknesses also in the presence of optical/electronic disturbances and noises and in industrial environments by means of interferometric optical retroreflection using incoherent light with superluminescent diodes.
Tipologia CRIS:
Brevetto
Keywords:
Industrial sensors
Elenco autori:
Rovati, Luigi
Link alla scheda completa:
Titolo del libro:
SPIE OE magazine