Short description:
INTERFEROMETRICAL, OPTICAL RETROREFLECTION WITH LOW COHERENCE SOURCE / Rovati, Luigi.
abstract:
Carrying out measurements of distances and thicknesses also in the presence of optical/electronic disturbances and noises and in industrial environments by means of interferometric optical retroreflection using incoherent light with superluminescent diodes.
Iris type:
Brevetto
Keywords:
Industrial sensors
List of contributors:
Rovati, Luigi
Book title:
SPIE OE magazine