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Pubblicazioni
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Rivista
Codice:
E079943
ISSN:
0018-9499
Dati Generali
Dati Generali
Pubblicazioni (26)
Pulisci
Ordina Pubblicazioni:
ascendente
decrescente
A complete radiation reliability software simulator
Articolo
A model of radiation induced leakage current (RILC) in ultra-thin gate oxides
Contributo in Atti di convegno
A novel silicon microstrip termination structure with all p-type multiguard and scribe-line implants
Articolo
Analysis of uniformity of as prepared and irradiated SI GaAs radiation detectors
Articolo
Analytical model for the ohmic-side interstrip resistance of double-sided silicon microstrip detectors
Articolo
Anomalous charge loss from Floating-Gate Memory Cells due to heavy ions irradiation
Articolo
Charge preamplifier for hole collecting PIN diode and integrated tetrode N-JFET
Articolo
DEGRADATION OF SILICON AC-COUPLED MICROSTRIP DETECTORS INDUCED BY RADIATION
Articolo
Data retention after heavy ion exposure of Floating Gate memories: analysis and simulation
Articolo
Electron Interference via a 4096-Pixel
MAPS Detector Designed for
High-Energy Physics Experiments
Articolo
Epitaxial silicon carbide for X-ray detection
Articolo
Experimental Determination of the Impact Ionization Coefficients in Irradiated Silicon
Articolo
Experimental and Simulation Studies of the Effects of Heavy-Ion Irradiation on HfO2-Based RRAM Cells
Articolo
Forward and reverse characteristics of irradiated MOSFET's
Articolo
Integration of front-end electronics with GaAs pixel detectors: Experimental and feasibility analysis
Articolo
On-Chip Fast Data Sparsification for a Monolithic 4096-Pixel Device
Articolo
Punch-through characteristics of FOXFET biased detectors
Articolo
RADIATION TOLERANCE OF THE FOXFET BIASING SCHEME FOR AC-COUPLED SI MICROSTRIP DETECTORS
Articolo
Radiation detection properties of 4H-SiC Schottky diodes irradiated up to 10(16) n/cm(2) by 1 MeV neutrons
Articolo
Radiation effects on breakdown characteristics of multiguarded devices
Articolo
Radiation effects on floating-gate memory cells
Contributo in Atti di convegno
Radiation induced leakage current in floating gate memory cells
Articolo
Studies of the effects of CO2 contamination of the neon gas radiator on the performance of the NA62 RICH detector
Articolo
Study of breakdown effects in silicon multiguard structures
Articolo
Total Ionizing Dose Effects in Si-Based Tunnel FETs
Articolo
Two-dimensional numerical simulation of edge-generated currents in type-inverted, single-sided silicon microstrip detectors
Articolo
No Results Found
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