PROCEEDINGS OF THE EUROPEAN SOLID STATE DEVICE RESEARCH CONFERENCE

Series

Identifier:

E212584

ISSN:

1930-8876

Overview

Research Outputs (48)

20.3dB 0.39mW AM Detector with Single-Transistor Active Inductor in Bendable a-IGZO TFT

Conference Paper

A Multi-Subband Monte Carlo study of electron transport in strained SiGe n-type FinFETs

Conference Paper

A Novel Temperature Estimation Technique Exploiting Carrier Emission from Buffer Traps

Conference Paper

A comparison between semi-classical and quantum-mechanical escape-times for gate current calculations

Conference Paper

A new model for tunneling conduction in ultra-thin dielectrics

Conference Paper

A new verilog-A compact model of random telegraph noise in oxide-based RRAM for advanced circuit design

Conference Paper

AlN-based MEMS devices for vibrational energy harvesting applications

Conference Paper

Analysis of RTN and cycling variability in HfO2 RRAM devices in LRS

Conference Paper

Analysis of TFET based 6T SRAM cells implemented with state of the art silicon nanowires

Conference Paper

Assessment of the Impact of Biaxial Strain on the Drain Current of Decanometric n-MOSFET

Conference Paper

Breakdown investigation in GaN-based MIS-HEMTdevices

Conference Paper

Carrier Quantization in SOI MOSFETs using an Effective Potential Based Monte-Carlo Tool

Conference Paper

Cathode Hot Electrons and Anode Hot Holes in Tunneling MOS Capacitors

Conference Paper

Characterization and Modeling of long term retention in SONOS Non Volatile Memories

Conference Paper

Characterization of anomalous Random Telegraph Noise in Resistive Random Access Memory

Conference Paper

Closed-form transition rate in hopping conduction

Conference Paper

Connecting RRAM Performance to the Properties of the Hafnia-based Dielectrics

Conference Paper

Defects Motion as the Key Source of Random Telegraph Noise Instability in Hafnium Oxide

Conference Paper

Does Multi Trap Assisted Tunneling Explain the Oxide Thickness Dependence of the Statistics of SILC in FLASH Memory Arrays ?

Conference Paper

Energy-efficient logic-in-memory I-bit full adder enabled by a physics-based RRAM compact model

Conference Paper

Experimental Demonstration of Improved Analog Device Performance in GAA-NW-TFETs

Conference Paper

Experimental characterization of the Static Noise Margins of strained Silicon complementary Tunnel-FET SRAM

Conference Paper

Explanation of current crowding phenomena induced by impact ionization in advanced Si bipolar transistors by means of electrical measurements and light emission microscopy

Conference Paper

Fabrication, Characterization and Modeling of Strained SOI MOSFETs with Very Large Effective Mobility

Conference Paper

Gate Current in Stacked Dielectrics for Advanced FLASH EEPROM cells

Conference Paper

Impact ionization phenomena in AlGaAs/GaAs HBTs

Conference Paper

Impact of Device Geometry of the Fin Electron-Hole Bilayer Tunnel FET

Conference Paper

Impact of the Charge Transport in the Conduction Band on the Retention of Si-Nitride Based Memories

Conference Paper

Investigation on convergence and stability of self-consistent Monte Carlo device simulations

Conference Paper

Measurements of avalanche effects and light emission in advanced Si and SiGe bipolar transistors

Conference Paper

Modeling the Dynamic Self-Heating of PCM

Conference Paper

Monte Carlo simulation of program and erase charge distribution in NROM devices

Conference Paper

Observation of a new hole gate current component in p(+)-poly gate p-channel MOSFET's

Conference Paper

On the Optimization of SiGe and III-V Compound Hetero-Junction Tunnel FET Devices

Conference Paper

On the RESET-SET transition in Phase Change Memories

Conference Paper

Performance Study of Strained III-V Materials for Ultra-Thin Body Transistor Applications

Conference Paper

Phonon Limited Uniform Transport in Bilayer Graphene Transistors

Conference Paper

Photon emission from sub-micron p-channel mosfets biased at high fields

Conference Paper

Probing defects generation during stress in high-κ/metal gate FinFETs by random telegraph noise characterization

Conference Paper

Random Telegraph Noise analysis to investigate the properties of active traps of HfO2-Based RRAM in HRS

Conference Paper

Random Telegraph Signal Noise Properties of HfOx RRAM in High Resistive States

Conference Paper

Revised analysis of the mobility and ION degradation in high-k gate stacks: surface optical phonons vs. remote Coulomb scattering

Conference Paper

SIMPLY: Design of a RRAM-Based Smart Logic-in-Memory Architecture using RRAM Compact Model

Conference Paper

Self-consistent Automated Parameter Extraction of RRAM Physics-Based Compact Model

Conference Paper

The Monte Carlo approach to transport modeling in deca-nanometer MOSFETs

Conference Paper

Trading off static power and dynamic performance in CMOS digital circuits: bulk versus double gate SOI MOSFETs

Conference Paper

Two Dimensional Quantum Mechanical Simulation of Low Dimensional Tunneling Devices

Conference Paper

Welcome to ESSDERC 2014

Conference Paper

No Results Found

PROCEEDINGS OF THE EUROPEAN SOLID STATE DEVICE RESEARCH CONFERENCE

Overview

Research Outputs (48)