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Pubblicazioni

MICROELECTRONIC ENGINEERING

Rivista

Codice:

E109971

ISSN:

0167-9317

Dati Generali

Dati Generali

Pubblicazioni (38)

Ordina Pubblicazioni:

ascendente
decrescente

A novel technique exploiting C-V, G-V and I-V simulations to investigate defect distribution and native oxide in high-κ dielectrics for III-V MOSFETs

Articolo

A percolative simulation of electromigration phenomena

Articolo

A simple figure of merit to identify the first layer to degrade and fail in dual layer SiOx/HfO2 gate dielectric stacks

Articolo

A study of the leakage current in TiN/HfO2/TiN capacitors

Articolo

Backscattering and common-base current gain of the Graphene Base Transistor (GBT)

Articolo

BipFLASH: a Novel Non-Volatile Memory Cell Concept for High Speed - Low Power Applications

Articolo

Characterization of a new cobalt precursor for focused beam deposition of magnetic nanostructures

Articolo

Charge transport in high-k stacks for charge-trapping memory applications: A modeling perspective (invited)

Articolo

Comprehensive physics-based RRAM compact model including the effect of variability and multi-level random telegraph noise

Articolo

Copper–titanium thin film interaction

Articolo

Design, fabrication and characterization of plasmonic gratings for SERS

Articolo

Directly nanopatternable nanoporous titania - Application to cell growth engineering

Articolo

Electrical characterization of suspended Pt nanowires grown by EBID with water vapour assistance

Articolo

Electromigration testing of integrated circuit interconnections

Articolo

Experimental Study of Low Voltage Anode Hole Injection in Thin Oxides

Contributo in Atti di convegno

Explanation of current crowding phenomena induced by impact ionization in advanced Si bipolar transistors by means of electrical measurements and light emission microscopy

Articolo

FIB lithography of nanoporous gold slits for extraordinary transmission

Articolo

Fabrication of metamaterials in the optical spectral range

Articolo

Impact-ionization phenomena in AlGaAs/GaAs HBT's

Articolo

Improved understanding of metal–graphene contacts

Articolo

Initial reactions in Ti-Si(Mo) bilayers

Articolo

Measurements of Low Field Mobility in Ultra Thin SOI n- and p-MOSFETs

Articolo

Measurements of avalanche effects and light emission in advanced Si and SiGe bipolar transistors

Articolo

Microelectronic Engineering: Preface

Contributo in Atti di convegno

Modeling, simulation and design of the vertical Graphene Base Transistor

Articolo

Modified three-dimensional nanoantennas for infrared hydrogen detection

Articolo

NROM™ - A new non-volatile memory technology: From device to products

Contributo in Atti di convegno

Nanoimprint Lithography For Organic Electronics

Articolo

New Charge Pumping model for the analysis of the spatial trap distribution in the nitride layer of SONOS devices

Articolo

Organic ice resists for 3D electron-beam processing: Instrumentation and operation

Articolo

Phase formations in Co-Silicon system

Articolo

Program efficiency and high temperature retention of SiN/high-K based memories

Articolo

Silicon Luminescence Techniques for the Characterization of Hot-Carrier and Degradation Phenomena in MOS Devices

Articolo

SrTiOx for sub-20 nm DRAM technology nodes - Characterization and modeling

Articolo

Techniques for mechanical strain analysis in sub-micrometer structures: TEM/CBED, micro-Raman spectroscopy, X-ray microdiffraction and modeling

Articolo

Trade-offs between tunneling and Hot-Carrier Injection in short channel Floating Gate MOSFETs

Articolo

Ultra-low power logic in memory with commercial grade memristors and FPGA-based smart-IMPLY architecture

Articolo

Zirconia based functional sol-gel resist for UV and high resolution lithography

Articolo

No Results Found

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