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  1. Pubblicazioni

SOLID-STATE ELECTRONICS

Rivista
Codice:
E156883
ISSN:
0038-1101
  • Dati Generali

Dati Generali

Pubblicazioni (85)

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A MANY-BAND SILICON MODEL FOR HOT-ELECTRON TRANSPORT AT HIGH-ENERGIES
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A New High Injection Efficiency Non Volatile Memory Cell: BipFlash
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A comparison of advanced transport models for the computation of the drain current in nanoscale nMOSFETs
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A new analytical model for the energy dispersion in two-dimensional hole inversion layers
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A quasi-analytical model for nanowire FETs with arbitrary polygonal cross section
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A study on HfO2 RRAM in HRS based on I–V and RTN analysis
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An Improved Semi-Classical Monte Carlo Approach for Nano-MOSFET Simulation
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Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: Experimental data and numerical simulation
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Analysis of quantum features in transport theory from a quantum monte carlo approach
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Analytical and numerical study of the impact of HALOS on short channel and hot carrier effects in scaled MOSFETs
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Anomalous random telegraph noise and temporary phenomena in resistive random access memory
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Assessment of dual-oxide options for LDMOS transistors in FinFET technology
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Benchmarks of a III-V TFET technology platform against the 10-nm CMOS FinFET technology node considering basic arithmetic circuits
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Calibrated multi-subband Monte Carlo modeling of tunnel-FETs in silicon and III–V channel materials
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Can photon emission/absorption processes explain the substrate current of tunneling MOS capacitors ?
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Carbon-doped GeTe: A promising material for Phase-Change Memories
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Characterization of DC performance and low-frequency noise of an array of nMOS Forksheets from 300 K to 4 K
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Comprehensive comparison and experimental validation of band-structure calculation methods in III–V semiconductor quantum wells
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Defects in polysilicon channel: Insight from first principles and multi-scale modelling
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Digital and analog TFET circuits: Design and benchmark
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Drain Current Improvements in Uniaxially Strained p-MOSFETs: a Multi-Subband Monte Carlo Study
Contributo in Atti di convegno
Drain current improvements in uniaxially strained p-MOSFETs: A Multi-Subband Monte Carlo study
Articolo
ELECTRONIC-STRUCTURE OF THIN SI LAYERS IN CAF2 - HYBRIDIZATION VERSUS CONFINEMENT
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Editorial: Letters from the 8th Joint International EUROSOI workshop and International Conference on Ultimate Integration on Silicon
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Editorial: Selected papers from the 8th Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS 2022)
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Effect of the choice of the tunnelling path on semi-classical numerical simulations of TFET devices
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Effects of mole fraction variations and scaling on total variability in InGaAs MOSFETs
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Experimental Application of a Novel Technique to Extract Gate Bias Dependent Source and Drain Parasitic Resistances of GaAs MESFETs
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Experimental demonstration of improved analog device performance of nanowire-TFETs
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Experimental evaluation of the minimum detectable outdiffusion length for AlGaAs/GaAs HBTs
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Foreword
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Full direct low frequency noise characterization of GaAs heterojunction bipolar transistors
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Grain boundary-driven leakage path formation in HfO2 dielectrics
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High-k/InGaAs interface defects at cryogenic temperature
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Hot phonons in quantum wells system
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Impact of bias conditions on electrical stress and ionizing radiation effects in Si-based TFETs
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Impact of gamma irradiation on the RF phase noise capability of UHV/CVD SiGe HBTs
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Improvement of contact resistance in flexible a-IGZO thin-film transistors by CF4/O-2 plasma treatment
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Interpretation of graphene mobility data by means of a semiclassical Monte Carlo transport model
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Investigating the correlation between interface and dielectric trap densities in aged p-MOSFETs using current-voltage, charge pumping, and 1/f noise characterization techniques
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Junction heterostructures for high performance electronics
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Layout effects on the thermal metrics of multichannel FinFETs
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Long term charge retention dynamics of SONOS cells
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Low frequency noise behaviour of InP/InGaAs heterojunction bipolar waveguide phototransistors
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Magneto-acoustic phonon antiresonances in Wannier-Stark superlattices
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Mobility extraction in SOI MOSFETs with sub 1 nm body thickness
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Modeling and optimization of graphene ballistic rectifiers
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Modelling the Uniform Transport in Thin Film SOI MOSFETs with a Monte Carlo Simulator for the 2D Electron Gas
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Models for the use of commercial TCAD in the analysis of silicon-based integrated biosensors
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Monte Carlo analysis of hot electron injection in the passivation layer of GaN HEMTs
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Monte-Carlo Simulation of Decananometric nMOSFETs: Multi-Subband vs. 3D-Electron Gas with Quantum Corrections
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Monte-Carlo analysis of signal propagation delay and AC performance of decananometric bulk and double-gate MOSFETs
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Monte-Carlo simulation of MOSFETs with band offsets in the source and drain
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Multi-Subband Monte Carlo simulations of ION degradation due to fin thickness fluctuations in FinFETs
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NROM (TM) - a new technology for non-volatile memory products
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Negative Vbe shift due to base dopant outdiffusion in DHBT
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Noise behavior in SiGe devices
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Non-local microscopic view of signal propagation times in BJTs biased up to high currents
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Numerical and analytical models to investigate the AC high-frequency response of nanoelectrode/SAM/electrolyte capacitive sensing elements
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OPTICAL PHONON PROBES OF THE LATERAL SCALE OF INTERFACE ROUGHNESS - A THEORETICAL INVESTIGATION
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On the accuracy of current TCAD hot carrier injection models in nanoscale devices
Articolo
On the accuracy of the formula used to extract trap density in MOSFETs from 1/f noise
Contributo in Atti di convegno
On the electron mobility enhancement in biaxially strained Si MOSFETs
Articolo
On the extraction of the channel current in permeable gate oxide MOSFETs
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On the interpretation of MOS impedance data in both series and parallel circuit topologies
Articolo
Optimization of GaAs/AlGaAs staircase avalanche photodiodes accounting for both electron and hole impact ionization
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PHONONS AND ELECTRON-PHONON INTERACTION IN GAAS QUANTUM WIRES
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RTS Noise Characterization of HfOx RRAM in High Resistive State
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STT-MTJ Based Smart Implication for Energy-Efficient Logic-in-Memory Computing
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Selected papers from ESSDERC 2014
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Selected papers from the EUROSOI-ULIS conference
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Semi-classical transport in MoS2 and MoS2 transistors by a Monte Carlo approach
Articolo
Simple and efficient modeling of the E–k relationship and low-field mobility in Graphene Nano-Ribbons
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Simulation of low Schottky barrier MOSFETs using an improved Multi-subband Monte Carlo model
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Smart Material Implication Using Spin-Transfer Torque Magnetic Tunnel Junctions for Logic-in-Memory Computing
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Solid-State Electronics: Foreword
Articolo
Statistical analysis of random telegraph noise in HfO2-based RRAM devices in LRS
Articolo
THEORETICAL-ANALYSIS OF RESONANT MAGNETOTUNNELING SPECTROSCOPY OF HOLES
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The Monte Carlo approach to transport modeling in deca-nanometer MOSFETs
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The impact of interface states on the mobility and drive current of In 0.53Ga 0.47As semiconductor n-MOSFETs
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Topology investigation for the low frequency noise compact modelling of bipolar transistors
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Transient hot-phonon effects on the velocity overshoot of GaAs: a Monte Carlo analysis
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Two dimensional quantum mechanical simulation of low dimensional tunneling devices
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V-grooved quantum wires as prototypes of 1D-systems: Single particle properties and correlation effects
Articolo
VIBRATIONAL PROPERTIES OF SI/GE SUPERLATTICES - THEORY AND INPLANE RAMAN-SCATTERING EXPERIMENTS
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No Results Found
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