Identifier:
E079839
ISSN:
0741-3106
Overview
Research Outputs (73)
A Physical Model for Post-Breakdown Digital Gate Current Noise
Academic ArticleCharge Transport and Degradation in HfO2 and HfOx Dielectrics
Academic ArticleFlexible InGaZnO TFTs With f(max) Above 300 MHz
Academic ArticleGate-Bias Induced RON Instability in p-GaN Power HEMTs
Academic ArticleHot Hole Gate Current in Surface Channel p-MOSFETs
Academic ArticleModeling NAND Flash Memories for IC Design
Academic ArticleMonte Carlo Simulation of Impact Ionization in SiGe HBTs
Academic ArticleNROM: A novel localized trapping, 2-bit nonvolatile memory cell
Academic ArticleOn the Apparent Mobility in Nanometric n-MOSFETs
Academic ArticlePhysics-Based Explanation of Kink Dynamics in AlGaAs/GaAs HFETs
Academic ArticleTemperature impact on the reset operation in HfO2 RRAM
Academic ArticleThree dimensional distribution of CMOS Latch-up current
Academic ArticleTrap characterization in buried-gate n-channel 6H-SiC JFETs
Academic Articlep-capped GaN-AlGaN-GaN high-electron mobility transistors (HEMTs)
Academic ArticleNo Results Found