Identifier:
E079923
ISSN:
0018-9383
Overview
Research Outputs (178)
A model of the stress induced leakage current in gate oxides
Academic ArticleAnalytical Model for Power Switching GaN-Based HEMT Design
Academic ArticleBreakdown walkout in pseudomorphic HEMT's
Academic ArticleCharge Trapping Mechanism Leading to Sub-60-mV/decade-Swing FETs
Academic ArticleEngineering Barrier and Buffer Layers in InGaAs Quantum-Well MOSFETs
Academic ArticleLayout Dependence of CMOS Latchup
Academic ArticleMicro breakdown in small-area ultra-thin gate oxide
Academic ArticleModelling of Light-Addressable Potentiometric Sensors
Academic ArticleOn the physical mechanism of the NROM memory erase
Academic ArticleParameter extraction from I-V characteristics of single MOSFETs
Academic ArticlePlasma-induced Micro Breakdown in small area MOSFETs
Academic ArticleReliability of Logic-in-Memory Circuits in Resistive Memory Arrays
Academic ArticleReliability testing of InP HEMT's using electrical stress methods
Academic ArticleSimulation of DC and RF Performance of the Graphene Base Transistor
Academic ArticleStrain-Induced Performance Improvements in InAs Nanowire Tunnel FETs
Academic ArticleSurface-related drain current dispersion effects in AlGaN-GaN HEMTs
Academic ArticleThin-Film Electronics on a Green and Flexible Cellulose-Based Film
Academic ArticleThree dimensional effects in dynamically triggered CMOS latch-up
Academic ArticleNo Results Found